Liu Y., He H. Y., Chen Y. Y., et al. Temperature-dependent Low-frequency Noise in Indium-Zinc-Oxide Thin-Film Transistors Down to 10 K. IEEE Transaction on Electron Device. 2019, 66(5): 2192-2197
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上一条：Liu Y., Wu W. J., Lei Z. F., et al. Instability of Indium Zinc Oxide Thin-Film Transistors Under Transmission Line Pulsed Stress. IEEE Electron Device Letters. 2014, 35(12): 1254-1256下一条：Liu Y., Chen R. S., Li B., et al. Analysis of Indium Zinc Oxide Thin Film Transistors under Electrostatic Discharge Stress. IEEE Transaction on Electron Device. 2018, 65(1): 356-360