Liu Y., Cai S. T., Xiong X. M., et al. Modeling of Contact Resistance Effect on Low Frequency Noise in Indium-Zinc-Oxide Thin-Film Transistors. Modern Physics Letters B. 2019. 33(17): 1950185
点击次数：
是否译文：否
上一条：Chen Y. Y., Ren Y., Liu Y.*, et al. Temperature Dependence of Conduction and Low Frequency Noise Characteristics in GaN Schottky Barrier Diodes. Modern Physics Letters B. 2020. Accept下一条：Zhong K., Liu Y.*, Cai S. T., et al. Temperature Dependence of Conduction and Low Frequency Noise Characteristics in Hydrogenated Amorphous Silicon Thin Film Transistors. Modern Physics Letters B. 2019, 33(2): 1950009