Zhong K., Liu Y.*, Cai S. T., et al. Temperature Dependence of Conduction and Low Frequency Noise Characteristics in Hydrogenated Amorphous Silicon Thin Film Transistors. Modern Physics Letters B. 2019, 33(2): 1950009
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上一条：Liu Y., Cai S. T., Xiong X. M., et al. Modeling of Contact Resistance Effect on Low Frequency Noise in Indium-Zinc-Oxide Thin-Film Transistors. Modern Physics Letters B. 2019. 33(17): 1950185下一条：Liu Y., En Y. F., and Fang W. X. Analysis of low frequency noise characteristics in p-type polycrystalline silicon thin film transistors. Modern Physics Letters B. 2017, 31(19-21): 1740020