Liu Y., He H. Y., Chen R. S., et al. Analysis and Simulation of Low Frequency Noise in the Indium Zinc Oxide Thin Film Transistors. IEEE Journal of the Electron Devices Society. 2018, 6(1): 271-279
点击次数：
是否译文：否
上一条：Liu Y., Cai S. T., Han C. Y., et al. Scaling Down Effect on Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors. IEEE Journal of the Electron Devices Society. 2019, 7(1): 203-207下一条：Zhong W., Yao R. H., Liu Y.*, et al. Effect of Self-Assembled Monolayers (SAMs) as Surface Passivation on the Flexible a-InSnZnO Thin-Film Transistors. IEEE Transaction on Electron Device. 2020, 67(8): 3157-3162