Liu Y., En Y. F., and Fang W. X. Analysis of low frequency noise characteristics in p-type polycrystalline silicon thin film transistors. Modern Physics Letters B. 2017, 31(19-21): 1740020
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上一条：Zhong K., Liu Y.*, Cai S. T., et al. Temperature Dependence of Conduction and Low Frequency Noise Characteristics in Hydrogenated Amorphous Silicon Thin Film Transistors. Modern Physics Letters B. 2019, 33(2): 1950009下一条：Liu K., Liu Y.*, Liu Y. R., et al. Comparative Study of Mobility Extraction Methods in P-type Polycrystalline Silicon Thin Film Transistors. Modern Physics Letters B. 2017, 31(19-21): 1740004