Liu Y., Wu W. J., Qiang L., et al. Temperature Dependence of Electrical Properties in Indium Zinc Oxide Thin Film Transistors. Chinese Physics Letters. 2015, 32(8): 088506.
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上一条：Liu Y., Liu K., Chen R., et al. Total-Ionizing-Dose Radiation Effects in the P-type Polycrystalline Silicon Thin Film Transistors. Chinese Physics Letters. 2017, 34(1): 018501下一条：Chen Y. Y., Ren Y., Liu Y.*, et al. Temperature Dependence of Conduction and Low Frequency Noise Characteristics in GaN Schottky Barrier Diodes. Modern Physics Letters B. 2020. Accept