Liu Y., Liu Y. R., He Y. J., et al. Low Frequency noise in the MOSFETs Processed in 65 nm Technology. Journal of Semiconductors. 2016, 37(6): 064012
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Liu Y., Liu Y. R., He Y. J., et al. Low Frequency noise in the MOSFETs Processed in 65 nm Technology. Journal of Semiconductors. 2016, 37(6): 064012
点击次数：
是否译文：否