Doctor of Engineering
Email :0a998994768e1f6b8555b16483c15ebb684fdba44d72d59d0df0f8114ca3a1566504958da5a4aa06daa74b4b74949a237a8c4e0affc86d96cf7653b16cd643158d52614366c6f2e04dc465c73464b79ced6bd97576da1b8df0571039500ca31746b0ec52109142fec42d589f404b1b2b369d9e7c386f55032a64828b6e229c6e
Translation or Not:no
Pre One:(18) QiuSheng Yan，Senkai Chen，Jisheng Pan(*)，Detection and Analysis of Subsurface Cracks of Single Crystal SiC Wafers Based on Cross-Sectional Microscopy Method，Advanced Materials Research，2014(1027)：240~245 EI收录Next One:(20) 阎秋生，高伟强，潘继生，发动机零部件气密性检测及其装备关键技术，机床与液压，2013 , 41 (4) :124-126
