主要论文 |
[1]Peng Liu, Zhiqiang You, Jigang Wu, Michael Elimu, Weizheng Wang, Shuo Cai and Yinhe Han, Defect Analysis and Parallel Testing for 3D Hybrid CMOS-Memristor Memory, IEEE Transactions on Emerging Topics in Computing, 9(2), 2021, pp. 745-758. [2]Peng Liu, Zhiqiang You, Jigang Wu, Bosheng Liu, Yinhe Han, and Krishnendu Chakrabarty,Fault Modeling and Efficient Testing of Memristor-based Memory, IEEE Transactions on Circuits and Systems I: Regular Paper, 68(2), 2021, pp.4444-4455. [3]Peng Liu, Hongxian Chen, Weihao Ni, Fan Li,Faster-Than-Nyquist 400G Implementation Using 126-Gbaud QPSK-OFDM With 88-GSa/s Undersampling, Frontiers in Physics, 9, 2021, pp. 1-7. [4]Yi Zhao, Hui Chen*, Peng Liu*, Jigang Wu, Dongxiang Luo, An improved reconfigurable logic in resistive random access memory, Integration, the VLSI Journal, 87, 2022, pp. 169-175. [5]Qingxiao Guan, Peng Liu*, Weiming Zhang, Wei Lu, Xinpeng Zhang, Double-Layered Dual-Syndrome Trellis Codes Utilizing Channel Knowledge for Robust Steganography, IEEE TRANSACTIONS ON INFORMATION FORENSICS AND SECURITY, 18, 2023, pp.501-516. [6]Zhen Wang, Guofa Zhang, Peng Liu*, Jing Ye, Jianhui Jiang, Accurate Reliability Boundary Evaluation of Approximate Arithmetic Circuit, IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 30(10), 2022 pp. 1507-1518. [7]LianYao, Peng Liu*, Jigang Wu*, Yinhe Han, Yuehang Zhong and Zhiqiang You, Integrating Two Logics into One Crossbar Array for Logic Gate Design, IEEE Transactions on Circuits and Systems II: Express Briefs, 68(8), 2021, pp. 2987-2991. [8]Peng Liu, Jigang Wu,Zhiqiang You,Michael Elimu,Weizheng Wangand Shuo Cai,“Defect Analysis and ParallelMarchAlgorithm for 3D Hybrid CMOS-Memristor Memory”, IEEE27thAsian Test Symposium,pp.25-29, 2018. (CCFC类会议) [9]Peng Liu, Zhiqiang You, Jishun Kuang, Michael Elimu, Shuo Cai and Weizheng Wang, “Logic Operation-based DFT Method and Parallel Test Algorithm for 1T1R Crossbar”, Electronics Letters, Vol. 53, No. 25, pp. 1631-1632, 2017. [10]Peng Liu, Zhiqiang You, Jishun Kuang, Zhipeng Hu, Heng Duan and Weizheng Wang, “Efficient March Test Algorithm for 1T1R Crossbar with Complete Fault Coverage”, Electronics Letters,Vol. 52, No. 18, 1520-1522, 2016. |